Genetic basis of resistance to leaf rust in tetraploid wheats

F Desiderio; D Guerra; AM Mastrangelo; D Rubiales; M Pasquini; R Simeone; A Blanco; L Cattivelli; Giampiero VALE'

Genetic basis of resistance to leaf rust in tetraploid wheats

F Desiderio, D Guerra, AM Mastrangelo, D Rubiales, M Pasquini, R Simeone, A Blanco, L Cattivelli, Giampiero VALE'

Dipartimento per lo Sviluppo Sostenibile e la Transizione Ecologica

Risultato della ricerca: Contributo alla conferenza › Contributo in Atti di Convegno › peer review

Abstract

Leaf rust, caused by Puccinia triticina Eriks., is one of the major constraints to durum wheat production. It is globally distributed with different race structures that continuously evolve and form novel virulent races. Growing resistant cultivars represent the most effective way of controlling rust diseases in wheat. In this paper we report a summary about the leaf rust genes (Lr), the quantitative trait loci (QTLs) and signiicant regions detected in tetraploid wheats

Lingua originale	Inglese
Pagine	447-452
Numero di pagine	6
Stato di pubblicazione	Pubblicato - 1 gen 2014

Keywords

Puccinia triticina – Tetraploid wheats – Genetic resistance – Mapping.

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@conference{c34584d8a0194b8ba02f35737bd0ef49,

title = "Genetic basis of resistance to leaf rust in tetraploid wheats",

abstract = "Leaf rust, caused by Puccinia triticina Eriks., is one of the major constraints to durum wheat production. It is globally distributed with different race structures that continuously evolve and form novel virulent races. Growing resistant cultivars represent the most effective way of controlling rust diseases in wheat. In this paper we report a summary about the leaf rust genes (Lr), the quantitative trait loci (QTLs) and signiicant regions detected in tetraploid wheats",

keywords = "Puccinia triticina – Tetraploid wheats – Genetic resistance – Mapping., Puccinia triticina – Tetraploid wheats – Genetic resistance – Mapping.",

author = "F Desiderio and D Guerra and AM Mastrangelo and D Rubiales and M Pasquini and R Simeone and A Blanco and L Cattivelli and Giampiero VALE'",

year = "2014",

month = jan,

day = "1",

language = "English",

pages = "447--452",

}

TY - CONF

T1 - Genetic basis of resistance to leaf rust in tetraploid wheats

AU - Desiderio, F

AU - Guerra, D

AU - Mastrangelo, AM

AU - Rubiales, D

AU - Pasquini, M

AU - Simeone, R

AU - Blanco, A

AU - Cattivelli, L

AU - VALE', Giampiero

PY - 2014/1/1

Y1 - 2014/1/1

N2 - Leaf rust, caused by Puccinia triticina Eriks., is one of the major constraints to durum wheat production. It is globally distributed with different race structures that continuously evolve and form novel virulent races. Growing resistant cultivars represent the most effective way of controlling rust diseases in wheat. In this paper we report a summary about the leaf rust genes (Lr), the quantitative trait loci (QTLs) and signiicant regions detected in tetraploid wheats

AB - Leaf rust, caused by Puccinia triticina Eriks., is one of the major constraints to durum wheat production. It is globally distributed with different race structures that continuously evolve and form novel virulent races. Growing resistant cultivars represent the most effective way of controlling rust diseases in wheat. In this paper we report a summary about the leaf rust genes (Lr), the quantitative trait loci (QTLs) and signiicant regions detected in tetraploid wheats

KW - Puccinia triticina – Tetraploid wheats – Genetic resistance – Mapping.

UR - https://iris.uniupo.it/handle/11579/102077

M3 - Paper

SP - 447

EP - 452

ER -

Genetic basis of resistance to leaf rust in tetraploid wheats

Abstract

Keywords

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