Excess noise and refiring processes in thick-film resistors

M. Prudenziati, B. Morten, A. Masoero

Risultato della ricerca: Contributo su rivistaArticolo in rivistapeer review

Abstract

Excess noise in thick-film resistors (TFRs) fired from one to ten times under the same firing profile has been investigated. The changes in structure and composition, which are responsible for variations in sheet resistivity and TCR, affect also the noise index of TFRS, sometimes in a substantial way, and the changes in noise index depend both on the resistor composition and the nature of the substrate. Moreover, the excess noise appears to be correlated to physico-chemical phenomena induced by refiring in the bulk of the resistors, much more than to changes in the density of microdefects (or microvoids) in the resistors investigated.

Lingua originaleInglese
Numero di articolo024
pagine (da-a)1355-1362
Numero di pagine8
RivistaJournal Physics D: Applied Physics
Volume14
Numero di pubblicazione7
DOI
Stato di pubblicazionePubblicato - 1981
Pubblicato esternamente

Fingerprint

Entra nei temi di ricerca di 'Excess noise and refiring processes in thick-film resistors'. Insieme formano una fingerprint unica.

Cita questo