Epistemic uncertainty propagation in a Weibull environment for a two-core system-on-chip

Riccardo Pinciroli, Andrea Bobbio, Cristiana Bolchini, Davide Cerotti, Marco Gribaudo, Antonio Miele, Kishor Trivedi

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Abstract

Epistemic uncertainty analysis accounts for inaccurate input parameters and evaluates how such uncertainty propagates to output measures. In this work we will focus on Weibull distributions, in particular the one related to the reliability of multi-core systems-on-chips. We focus on a two-core system in which, when one of the cores fails, the other can take care of all the systems' tasks. However, this results in an increased operational temperature that leads to a reduced lifetime. We first discuss the epistemic uncertainty distribution that we expect when we estimate the scale parameter of a Weibull distribution from a limited set of samples. We then extend the procedure to consider the epistemic uncertainty in the two core system-on-chip when we can measure the failure times of the first and of the second core.

Lingua originaleInglese
Titolo della pubblicazione ospite2017 2nd International Conference on System Reliability and Safety, ICSRS 2017
EditoreInstitute of Electrical and Electronics Engineers Inc.
Pagine516-520
Numero di pagine5
ISBN (elettronico)9781538633229
DOI
Stato di pubblicazionePubblicato - 2 lug 2017
Evento2nd International Conference on System Reliability and Safety, ICSRS 2017 - Milan, Italy
Durata: 20 dic 201722 dic 2017

Serie di pubblicazioni

Nome2017 2nd International Conference on System Reliability and Safety, ICSRS 2017
Volume2018-January

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???event.eventtypes.event.conference???2nd International Conference on System Reliability and Safety, ICSRS 2017
Paese/TerritorioItaly
CittàMilan
Periodo20/12/1722/12/17

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