Effects of prolonged flushing interval in totally implantable venous access devices (TIVADs)

Laura Rasero, Lisa Golin, Serena Ditta, Dino Stefano Di Massimo, Alberto Dal Molin, Guya Piemonte

Risultato della ricerca: Contributo su rivistaArticolo in rivistapeer review

Abstract

Totally implantable venous access device (TIVAD) lumen occlusion is a long-term complication of central venous catheters, associated with risks of infection, therapy interruptions and increased healthcare costs. The role of flushing and locking in maintaining TIVAD patency is paramount. Most flushing protocols are based on manufacturers' recommendations, which indicate that 4 weeks is the safest interval between two consecutive flushing procedures during periods when TIVADs are not in use. Conversely, results of several studies suggest that extended flushing intervals (FIs) do not increase the rate of obstructive or infective complications. The study aimed to describe the effects of prolonged FIs in a cohort of 317 patients with cancer. The authors found no significant difference in terms of TIVAD problems between long (>45 days) and short (≤45 days) FI groups, which raises questions over the validity of current practice.

Lingua originaleInglese
pagine (da-a)S4-S10
RivistaBritish Journal of Nursing
Volume27
Numero di pubblicazione8
DOI
Stato di pubblicazionePubblicato - 26 apr 2018

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