@inproceedings{483e77c475314c93be945927b69671df,
title = "Developments in the FBK Production of Ultra -Fast Silicon Detectors",
abstract = "In this contribution we present new developments in the production of Ultra Fast Silicon Detectors (UFSD) at Fondazione Bruno Kessler (FBK) in Trento, Italy. FBK after having in 2016 a successfully first production of UFSD sensors 300-micrometer thick, has produced in 2017 its first 50- micrometer thick UFSD sensors. These sensors use high resistivity Silicon on Silicon substrate and have different doping profile configurations of the gain layer based on Boron, Gallium, Carbonated Boron and Carbonated Gallium to obtain a controlled multiplication mechanism. The motivation of variety of gain layers it is to identify the most radiation hard technology to be employed in the production of UFSD for applications in high-radiation environments.",
author = "M. Ferrero and Ali, \{O. H.\} and R. Arcidiacono and M. Boscardin and N. Cartiglia and F. Cenna and R. Cirio and M. Costa and Betta, \{Dalla G.F.\} and F. Ficorella and S. Giordanengo and M. Mandurrino and V. Monaco and Obertino, \{M. M.\} and L. Pancheri and G. Paternoster and R. Sacchi and F. Siviero and V. Sola and A. Staian and A. Vignati",
note = "Publisher Copyright: {\textcopyright} 2017 IEEE.; 2017 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2017 ; Conference date: 21-10-2017 Through 28-10-2017",
year = "2018",
month = nov,
day = "12",
doi = "10.1109/NSSMIC.2017.8533035",
language = "English",
series = "2017 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2017 - Conference Proceedings",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
booktitle = "2017 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2017 - Conference Proceedings",
address = "United States",
}