Abstract
In this paper we present some experimental results concerning the current noise produced during the resistive transition in MgB2 thin films. Preliminary investigations evidenced the presence of electrical noise whose power spectrum has a region of the 1/fn type with n ∼ 3. We suggest that the noise may originate from abrupt rearrangement of the current distribution inside the specimen during the percolative process of a diphasic system. Experimental measurements of the spectral components of the current noise taken during the resistive transition will be given and discussed.
Lingua originale | Inglese |
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pagine (da-a) | 351-353 |
Numero di pagine | 3 |
Rivista | Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment |
Volume | 520 |
Numero di pubblicazione | 1-3 |
DOI | |
Stato di pubblicazione | Pubblicato - 11 mar 2004 |
Pubblicato esternamente | Sì |