TY - JOUR
T1 - Characterization of ultra-thin polymeric films by Gas chromatography-Mass spectrometry hyphenated to thermogravimetry
AU - Gianotti, Valentina
AU - Antonioli, Diego
AU - Sparnacci, Katia
AU - Laus, Michele
AU - Giammaria, Tommaso Jacopo
AU - Ceresoli, Monica
AU - Ferrarese Lupi, Federico
AU - Seguini, Gabriele
AU - Perego, Michele
N1 - Publisher Copyright:
© 2014 Elsevier B.V.
PY - 2014/11/14
Y1 - 2014/11/14
N2 - Polymeric materials are widely employed to build up tunable nanomasks for nano-patterning technologies. Ultrathin polymer layers are involved in this process. A Thermo Gravimetric Analysis-Mass Spectrometry (TGA-GC-MS) method was optimised, validated and successfully applied to investigate the thermal behavior of ultrathin poly(styrene-. r-methylmethacrylate) random copolymer layers P(S-r-MMA) grafted to a silicon wafer surface. The interface between TGA and MS is highly versatile since many instrumental parameters (i.e. loop volumes, pulsed sampling frequencies, acquisition modalities, carrier gases, flow rates) can be easily tuned. Samples featuring substantial scale difference, i.e. bulk materials, thick films (few μm thickness), thin and ultrathin films (few nm thickness) can be analyzed without any instrumental modification or sample pretreatments. The TGA-GC-MS analysis was used to highlight subtle differences in samples featuring different thicknesses, in the 2-6. nm range, and subjected to various thermal treatments, thus indicating that this hyphenated technique could be successfully applied to the investigation of ultrathin polymer films.
AB - Polymeric materials are widely employed to build up tunable nanomasks for nano-patterning technologies. Ultrathin polymer layers are involved in this process. A Thermo Gravimetric Analysis-Mass Spectrometry (TGA-GC-MS) method was optimised, validated and successfully applied to investigate the thermal behavior of ultrathin poly(styrene-. r-methylmethacrylate) random copolymer layers P(S-r-MMA) grafted to a silicon wafer surface. The interface between TGA and MS is highly versatile since many instrumental parameters (i.e. loop volumes, pulsed sampling frequencies, acquisition modalities, carrier gases, flow rates) can be easily tuned. Samples featuring substantial scale difference, i.e. bulk materials, thick films (few μm thickness), thin and ultrathin films (few nm thickness) can be analyzed without any instrumental modification or sample pretreatments. The TGA-GC-MS analysis was used to highlight subtle differences in samples featuring different thicknesses, in the 2-6. nm range, and subjected to various thermal treatments, thus indicating that this hyphenated technique could be successfully applied to the investigation of ultrathin polymer films.
KW - Method development
KW - Self-assembly materials
KW - Thermogravimetry-Gaschromatography-Mass spectrometry
KW - Ultra-thin films
KW - Validation
UR - http://www.scopus.com/inward/record.url?scp=84908210312&partnerID=8YFLogxK
U2 - 10.1016/j.chroma.2014.09.073
DO - 10.1016/j.chroma.2014.09.073
M3 - Article
SN - 0021-9673
VL - 1368
SP - 204
EP - 210
JO - Journal of Chromatography A
JF - Journal of Chromatography A
ER -