Understanding the direct detection of charged particles with SiPMs

F. Carnesecchi, G. Vignola, N. Agrawal, A. Alici, P. Antonioli, S. Arcelli, F. Bellini, D. Cavazza, L. Cifarelli, M. Colocci, S. Durando, F. Ercolessi, A. Ficorella, C. Fraticelli, M. Garbini, M. Giacalone, A. Gola, D. Hatzifotiadou, NICOLO' JACAZIO, A. MargottiG. Malfattore, R. Nania, F. Noferini, G. Paternoster, O. Pinazza, R. Preghenella, R. Rath, R. Ricci, L. Rignanese, N. Rubini, B. Sabiu, E. Scapparone, G. Scioli, S. Strazzi, S. Tripathy, A. Zichichi

Research output: Contribution to journalArticlepeer-review

Abstract

In this paper, evidence that the increased response of SiPM sensors to the passage of charged particles is related mainly to Cherenkov light produced in the protection layer is reported. The response and timing properties of sensors with different protection layers have been studied.
Original languageEnglish
Pages (from-to)1-4
Number of pages4
JournalTHE EUROPEAN PHYSICAL JOURNAL PLUS
Volume138
Issue number4
DOIs
Publication statusPublished - 2023

Keywords

  • solid-state detector
  • SiPM

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