Measurements of the Cherenkov effect in direct detection of charged particles with SiPMs

F. Carnesecchi; B. Sabiu; S. Strazzi; G. Vignola; N. Agrawal; A. Alici; P. Antonioli; S. Arcelli; F. Bellini; D. Cavazza; L. Cifarelli; M. Colocci; S. Durando; F. Ercolessi; D. Falchieri; A. Ficorella; C. Fraticelli; M. Garbini; M. Giacalone; A. Gola; D. Hatzifotiadou; NICOLO' JACAZIO; A. Margotti; G. Malfattore; R. Nania; F. Noferini; G. Paternoster; O. Pinazza; R. Preghenella; R. Rath; R. Ricci; L. Rignanese; G. Romanenko; N. Rubini; E. Scapparone; G. Scioli; A. Zichichi

doi:10.1140/epjp/s13360-023-04397-0

Measurements of the Cherenkov effect in direct detection of charged particles with SiPMs

F. Carnesecchi
, B. Sabiu
, S. Strazzi
, G. Vignola
, N. Agrawal
, A. Alici
, P. Antonioli
, S. Arcelli
, F. Bellini
, D. Cavazza
, L. Cifarelli
, M. Colocci
, S. Durando
, F. Ercolessi
, D. Falchieri
, A. Ficorella
, C. Fraticelli
, M. Garbini
, M. Giacalone
, A. Gola

D. Hatzifotiadou, NICOLO' JACAZIO, A. Margotti, G. Malfattore, R. Nania, F. Noferini, G. Paternoster, O. Pinazza, R. Preghenella, R. Rath, R. Ricci, L. Rignanese, G. Romanenko, N. Rubini, E. Scapparone, G. Scioli, A. Zichichi

Department of Science and Technological Innovation

Research output: Contribution to journal › Article › peer-review

Abstract

In this paper, different Silicon PhotoMultiplier (SiPM) sensors have been tested with charged particles to characterize the Cherenkov light produced in the sensor protection layer. A careful position scan of the SiPM response has been performed with different prototypes, confirming the large number of firing cells and proving almost full efficiency, with the SiPM filling factor essentially negligible. This study also allowed us to study the time resolution of such devices as a function of the number of firing cells, reaching values below 20 ps. These measurements provide significant insight into the capabilities of SiPM sensors in direct detection of charged particles and their potential for several applications.

Original language	English
Journal	THE EUROPEAN PHYSICAL JOURNAL PLUS
Volume	138
Issue number	9
DOIs	https://doi.org/10.1140/epjp/s13360-023-04397-0
Publication status	Published - 2023

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10.1140/epjp/s13360-023-04397-0

https://hdl.handle.net/11579/223402

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Carnesecchi, F., Sabiu, B., Strazzi, S., Vignola, G., Agrawal, N., Alici, A., Antonioli, P., Arcelli, S., Bellini, F., Cavazza, D., Cifarelli, L., Colocci, M., Durando, S., Ercolessi, F., Falchieri, D., Ficorella, A., Fraticelli, C., Garbini, M., Giacalone, M., ... Zichichi, A. (2023). Measurements of the Cherenkov effect in direct detection of charged particles with SiPMs. THE EUROPEAN PHYSICAL JOURNAL PLUS, 138(9). https://doi.org/10.1140/epjp/s13360-023-04397-0

@article{11514a2fa6464e34aa578718e7877516,

title = "Measurements of the Cherenkov effect in direct detection of charged particles with SiPMs",

abstract = "In this paper, different Silicon PhotoMultiplier (SiPM) sensors have been tested with charged particles to characterize the Cherenkov light produced in the sensor protection layer. A careful position scan of the SiPM response has been performed with different prototypes, confirming the large number of firing cells and proving almost full efficiency, with the SiPM filling factor essentially negligible. This study also allowed us to study the time resolution of such devices as a function of the number of firing cells, reaching values below 20 ps. These measurements provide significant insight into the capabilities of SiPM sensors in direct detection of charged particles and their potential for several applications.",

author = "F. Carnesecchi and B. Sabiu and S. Strazzi and G. Vignola and N. Agrawal and A. Alici and P. Antonioli and S. Arcelli and F. Bellini and D. Cavazza and L. Cifarelli and M. Colocci and S. Durando and F. Ercolessi and D. Falchieri and A. Ficorella and C. Fraticelli and M. Garbini and M. Giacalone and A. Gola and D. Hatzifotiadou and NICOLO' JACAZIO and A. Margotti and G. Malfattore and R. Nania and F. Noferini and G. Paternoster and O. Pinazza and R. Preghenella and R. Rath and R. Ricci and L. Rignanese and G. Romanenko and N. Rubini and E. Scapparone and G. Scioli and A. Zichichi",

year = "2023",

doi = "10.1140/epjp/s13360-023-04397-0",

language = "English",

volume = "138",

journal = "THE EUROPEAN PHYSICAL JOURNAL PLUS",

issn = "2190-5444",

number = "9",

}

Carnesecchi, F, Sabiu, B, Strazzi, S, Vignola, G, Agrawal, N, Alici, A, Antonioli, P, Arcelli, S, Bellini, F, Cavazza, D, Cifarelli, L, Colocci, M, Durando, S, Ercolessi, F, Falchieri, D, Ficorella, A, Fraticelli, C, Garbini, M, Giacalone, M, Gola, A, Hatzifotiadou, D, JACAZIO, NICOLO, Margotti, A, Malfattore, G, Nania, R, Noferini, F, Paternoster, G, Pinazza, O, Preghenella, R, Rath, R, Ricci, R, Rignanese, L, Romanenko, G, Rubini, N, Scapparone, E, Scioli, G & Zichichi, A 2023, 'Measurements of the Cherenkov effect in direct detection of charged particles with SiPMs', THE EUROPEAN PHYSICAL JOURNAL PLUS, vol. 138, no. 9. https://doi.org/10.1140/epjp/s13360-023-04397-0

TY - JOUR

T1 - Measurements of the Cherenkov effect in direct detection of charged particles with SiPMs

AU - Carnesecchi, F.

AU - Sabiu, B.

AU - Strazzi, S.

AU - Vignola, G.

AU - Agrawal, N.

AU - Alici, A.

AU - Antonioli, P.

AU - Arcelli, S.

AU - Bellini, F.

AU - Cavazza, D.

AU - Cifarelli, L.

AU - Colocci, M.

AU - Durando, S.

AU - Ercolessi, F.

AU - Falchieri, D.

AU - Ficorella, A.

AU - Fraticelli, C.

AU - Garbini, M.

AU - Giacalone, M.

AU - Gola, A.

AU - Hatzifotiadou, D.

AU - JACAZIO, NICOLO'

AU - Margotti, A.

AU - Malfattore, G.

AU - Nania, R.

AU - Noferini, F.

AU - Paternoster, G.

AU - Pinazza, O.

AU - Preghenella, R.

AU - Rath, R.

AU - Ricci, R.

AU - Rignanese, L.

AU - Romanenko, G.

AU - Rubini, N.

AU - Scapparone, E.

AU - Scioli, G.

AU - Zichichi, A.

PY - 2023

Y1 - 2023

N2 - In this paper, different Silicon PhotoMultiplier (SiPM) sensors have been tested with charged particles to characterize the Cherenkov light produced in the sensor protection layer. A careful position scan of the SiPM response has been performed with different prototypes, confirming the large number of firing cells and proving almost full efficiency, with the SiPM filling factor essentially negligible. This study also allowed us to study the time resolution of such devices as a function of the number of firing cells, reaching values below 20 ps. These measurements provide significant insight into the capabilities of SiPM sensors in direct detection of charged particles and their potential for several applications.

AB - In this paper, different Silicon PhotoMultiplier (SiPM) sensors have been tested with charged particles to characterize the Cherenkov light produced in the sensor protection layer. A careful position scan of the SiPM response has been performed with different prototypes, confirming the large number of firing cells and proving almost full efficiency, with the SiPM filling factor essentially negligible. This study also allowed us to study the time resolution of such devices as a function of the number of firing cells, reaching values below 20 ps. These measurements provide significant insight into the capabilities of SiPM sensors in direct detection of charged particles and their potential for several applications.

UR - https://iris.uniupo.it/handle/11579/223402

U2 - 10.1140/epjp/s13360-023-04397-0

DO - 10.1140/epjp/s13360-023-04397-0

M3 - Article

SN - 2190-5444

VL - 138

JO - THE EUROPEAN PHYSICAL JOURNAL PLUS

JF - THE EUROPEAN PHYSICAL JOURNAL PLUS

IS - 9

ER -

Measurements of the Cherenkov effect in direct detection of charged particles with SiPMs

Abstract

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