“Excess noise in 
 thick film resistors: The volume dependence.”

MASOERO Aldo, MORTEN B., TAMBORIN M., PRUDENZIATI M.

Research output: Contribution to journal › Article

Original language	English
Pages (from-to)	5-8
Number of pages	4
Journal	Microelectronics International
Volume	37
Publication status	Published - 1 Jan 1995
Externally published	Yes

Cite this

@article{cb2d56273e3c46e987b337dd5ac63d3f,

title = "“Excess noise in thick film resistors: The volume dependence.”",

author = "MASOERO Aldo and MORTEN B. and TAMBORIN M. and PRUDENZIATI M.",

year = "1995",

month = jan,

day = "1",

language = "English",

volume = "37",

pages = "5--8",

journal = "Microelectronics International",

issn = "1356-5362",

publisher = "Emerald Group Publishing Ltd.",

}