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“Excess noise in thick film resistors: The volume dependence.”

  • MASOERO Aldo
  • , MORTEN B.
  • , TAMBORIN M.
  • , PRUDENZIATI M.

Research output: Contribution to journalArticle

Original languageEnglish
Pages (from-to)5-8
Number of pages4
JournalMicroelectronics International
Volume37
Publication statusPublished - 1 Jan 1995
Externally publishedYes

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