Excess noise and its temperature dependence in thick-film (cermet) resistors

A. Masoero, A. M. Rietto, B. Morten, M. Prudenziati

Research output: Contribution to journalArticlepeer-review

Abstract

Measurements have been made of the current noise in thick-film resistors (TFR) based on Ru-pyrochlore conductive grains, with sheet resistivities covering a range of four decades. The temperature dependence of the exponent alpha in the 1/falpha noise spectra and of the relative integral noise was investigated in the temperature range from 77 to 650K. It is shown that the presence of a minimum in the relative voltage noise fluctuations ( Delta V2)/(V)2 is a general phenomenon, as is the increase in alpha with increasing temperature. Nevertheless these two effects seem not to be mutually correlated. The possibility of developing an interpretive model for noise phenomena in TFR is discussed.

Original languageEnglish
Article number027
Pages (from-to)669-674
Number of pages6
JournalJournal Physics D: Applied Physics
Volume16
Issue number4
DOIs
Publication statusPublished - 1983
Externally publishedYes

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