TY - GEN
T1 - Epistemic uncertainty propagation in a Weibull environment for a two-core system-on-chip
AU - Pinciroli, Riccardo
AU - Bobbio, Andrea
AU - Bolchini, Cristiana
AU - Cerotti, Davide
AU - Gribaudo, Marco
AU - Miele, Antonio
AU - Trivedi, Kishor
N1 - Publisher Copyright:
© 2017 IEEE.
PY - 2017/7/2
Y1 - 2017/7/2
N2 - Epistemic uncertainty analysis accounts for inaccurate input parameters and evaluates how such uncertainty propagates to output measures. In this work we will focus on Weibull distributions, in particular the one related to the reliability of multi-core systems-on-chips. We focus on a two-core system in which, when one of the cores fails, the other can take care of all the systems' tasks. However, this results in an increased operational temperature that leads to a reduced lifetime. We first discuss the epistemic uncertainty distribution that we expect when we estimate the scale parameter of a Weibull distribution from a limited set of samples. We then extend the procedure to consider the epistemic uncertainty in the two core system-on-chip when we can measure the failure times of the first and of the second core.
AB - Epistemic uncertainty analysis accounts for inaccurate input parameters and evaluates how such uncertainty propagates to output measures. In this work we will focus on Weibull distributions, in particular the one related to the reliability of multi-core systems-on-chips. We focus on a two-core system in which, when one of the cores fails, the other can take care of all the systems' tasks. However, this results in an increased operational temperature that leads to a reduced lifetime. We first discuss the epistemic uncertainty distribution that we expect when we estimate the scale parameter of a Weibull distribution from a limited set of samples. We then extend the procedure to consider the epistemic uncertainty in the two core system-on-chip when we can measure the failure times of the first and of the second core.
KW - epistemic uncertainty
KW - min/max weibull distributions
KW - multi-core system-on-chip
KW - uncertainty propagation
KW - weibull distribution
UR - https://www.scopus.com/pages/publications/85046622777
U2 - 10.1109/ICSRS.2017.8272875
DO - 10.1109/ICSRS.2017.8272875
M3 - Conference contribution
AN - SCOPUS:85046622777
T3 - 2017 2nd International Conference on System Reliability and Safety, ICSRS 2017
SP - 516
EP - 520
BT - 2017 2nd International Conference on System Reliability and Safety, ICSRS 2017
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2nd International Conference on System Reliability and Safety, ICSRS 2017
Y2 - 20 December 2017 through 22 December 2017
ER -